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System-on-chip test architectures [electronic resource] : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.

Contributor(s): Material type: TextSeries: Morgan Kaufmann series in systems on siliconPublication details: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.Description: xxxvi, 856 p. : illSubject(s): Genre/Form: DDC classification:
  • 621.39/5 22
LOC classification:
  • TK7895.E42 S978 2008eb
Online resources:
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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