<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[Rongo Univesity Library Search for 'se,phr:&quot;Advanced micro &amp; nanosystems.&quot;']]> </title> <!-- prettier-ignore-start --> <link> http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-search.pl?q=ccl=se%2Cphr%3A%22Advanced%20micro%20%26%20nanosystems.%22&#38;sort_by=relevance&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-search.pl?q=ccl=se%2Cphr%3A%22Advanced%20micro%20%26%20nanosystems.%22&#38;sort_by=relevance&#38;format=rss" /> <description> <![CDATA[ Search results for 'se,phr:&quot;Advanced micro &amp; nanosystems.&quot;' at Rongo Univesity Library]]> </description> <opensearch:totalResults>4</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-search.pl?q=ccl=se%2Cphr%3A%22Advanced%20micro%20%26%20nanosystems.%22&#38;sort_by=relevance&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dse%252Cphr%253A%2522Advanced%2520micro%2520%2526%2520nanosystems.%2522" startPage="" /> <item> <title> Reliability of MEMS testing of materials and devices / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=13786</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Weinheim : Wiley-VCH, 2013 .<br /> xx, 303 p. : , First edition 2007. </p> ]]> <![CDATA[ <p> <a href="http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-reserve.pl?biblionumber=13786">Place hold on <em>Reliability of MEMS</em></a> </p> ]]> </description> <guid>http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=13786</guid> </item> <item> <title> Reliability of MEMS testing of materials and devices / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=32120</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Weinheim : Wiley-VCH, 2013 .<br /> xx, 303 p. : , First edition 2007. </p> ]]> <![CDATA[ <p> <a href="http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-reserve.pl?biblionumber=32120">Place hold on <em>Reliability of MEMS</em></a> </p> ]]> </description> <guid>http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=32120</guid> </item> <item> <title> Inkjet-based micromanufacturing </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=109757</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Weinheim, Germany : Wiley-VCH, 2012 .<br /> xvi, 371 p. : </p> ]]> <![CDATA[ <p> <a href="http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-reserve.pl?biblionumber=109757">Place hold on <em>Inkjet-based micromanufacturing</em></a> </p> ]]> </description> <guid>http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=109757</guid> </item> <item> <title> Inkjet-based micromanufacturing </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=213578</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> Weinheim, Germany : Wiley-VCH, 2012 .<br /> xvi, 371 p. : </p> ]]> <![CDATA[ <p> <a href="http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-reserve.pl?biblionumber=213578">Place hold on <em>Inkjet-based micromanufacturing</em></a> </p> ]]> </description> <guid>http://opac.rongovarsity.ac.ke/cgi-bin/koha/opac-detail.pl?biblionumber=213578</guid> </item> </channel> </rss>
