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Advanced mathematical & computational tools in metrology & testing VIII

Advanced mathematical & computational tools in metrology & testing VIII [electronic resource] / Advanced mathematical and computational tools in metrology and testing VIII AMCTM 8 editors, F. Pavese ... [et al.]. - Singapore ; Hackensack, NJ : World Scientific, c2009. - xii, 406 p. : ill. - Series on advances in mathematics for applied sciences ; v. 78 . - Series on advances in mathematics for applied sciences ; v. 78. .

Includes bibliographical references and index.


Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2013.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.






Measurement--Congresses.
Physical measurements--Congresses.
Metrology--Congresses.


Electronic books.

QA465 / .A58 2008eb

530.8

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