ISTFA 2005
ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California / [electronic resource] :
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International.
- Materials Park, OH : ASM International, c2005.
- xviii, 524 p. : ill.
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electronics--Materials--Testing--Congresses.
Electronic apparatus and appliances--Testing--Congresses.
Electronic books.
TK7871 / .I63 2005eb
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electronics--Materials--Testing--Congresses.
Electronic apparatus and appliances--Testing--Congresses.
Electronic books.
TK7871 / .I63 2005eb