In-situ electron microscopy at high resolution (Record no. 12604)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01248nam a2200325Ia 4500 |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 502.825 |
| 245 00 - TITLE STATEMENT | |
| Title | In-situ electron microscopy at high resolution |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Hackensack, NJ : |
| Name of publisher | World Scientific, |
| Year of publication | c2008. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | vi, 311 p. : |
| Other physical details | ill. (some col.) |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Electron microscopy |
| Topical Term | High resolution electron microscopy. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Banhart, Florian. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://site.ebrary.com/lib/rucke/Doc?id=10688072 |
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