Beam effects, surface topography, and depth profiling in surface analysis (Record no. 73347)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01453nam a2200349 a 4500 |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 620/.44 |
| 245 00 - TITLE STATEMENT | |
| Title | Beam effects, surface topography, and depth profiling in surface analysis |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | New York : |
| Name of publisher | Plenum Press, |
| Year of publication | c1998. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xix, 430 p. : |
| Other physical details | ill. |
| 490 1# - SERIES STATEMENT | |
| Series statement | Methods of surface characterization ; |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Surfaces (Technology) |
| Topical Term | Materials |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Czanderna, Alvin Warren, |
| Personal name | Madey, Theodore E. |
| Personal name | Powell, C. J. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://site.ebrary.com/lib/rucke/Doc?id=10046976 |
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