Monte Carlo modeling for electron microscopy and microanalysis [electronic resource] / David C. Joy.
Material type:
TextSeries: Oxford series in optical and imaging sciences ; 9.Publication details: New York : Oxford University Press, 1995.Description: viii, 216 p. : illSubject(s): Genre/Form: DDC classification: - 502/.8/25 20
- QH212.E4 J67 1995eb
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Includes bibliographical references.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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