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Stochastic reliability modeling, optimization and applications [electronic resource] / editors, Syouji Nakamura, Toshio Nakagawa.

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Material type:

TextPublication details: Singapore ; Hackensack, NJ : World Scientific, c2010.Description: xvi, 300 p. : illSubject(s):

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Electronic books.

DDC classification:

620/.00452 22

LOC classification:

TA169 .S765 2010eb

Online resources:

An electronic book accessible through the World Wide Web; click to view

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Includes bibliographical references.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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