Terrestrial neutron-induced soft errors in advanced memory devices [electronic resource] / Takashi Nakamura ... [et al.].
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TextPublication details: Hackensack, NJ : World Scientific, c2008.Description: xxii, 343 p. : ill. (some col.)Subject(s): Genre/Form: LOC classification: - TK7895.M4 T47 2008eb
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Includes bibliographical references (p. 291-315) and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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