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CTL for test information of digital ICs [electronic resource] / by Rohit Kapur.

By: Contributor(s): Material type: TextPublication details: Boston : Kluwer Academic Publishers, 2003.Description: ix, 173 p. : illSubject(s): Genre/Form: DDC classification:
  • 621.3815/48 21
LOC classification:
  • TK7874.65 .K35 2003eb
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Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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