Beam effects, surface topography, and depth profiling in surface analysis [electronic resource] / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell.
Material type:
TextSeries: Methods of surface characterization ; v. 5.Publication details: New York : Plenum Press, c1998.Description: xix, 430 p. : illSubject(s): Genre/Form: DDC classification: - 620/.44 21
- TA418.7 .B43 1998eb
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Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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