Characterization of high Tc materials and devices by electron microscopy [electronic resource] / edited by Nigel D. Browning, Stephen J. Pennycook.
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TextPublication details: Cambridge ; New York : Cambridge University Press, 2000.Description: xii, 391 p. : illSubject(s): Genre/Form: DDC classification: - 537.6/23/0284 21
- QC611.98.H54 C43 2000eb
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Includes bibliographical references.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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