Computing systems reliability [electronic resource] : models and analysis / Min Xie, Yuan-Shum Dai, and Kim-Leng Poh.
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TextPublication details: New York : Kluwer Academic/Plenum Publishers, c2004.Description: xiii, 293 p. : illSubject(s): Genre/Form: DDC classification: - 004 22
- QA76.5 .X54 2004eb
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Includes bibliographical references (p. 275-289) and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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