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Operational risk management [electronic resource] : a practical approach to intelligent data analysis / edited by Ron S. Kenett, Yossi Raanan.

Contributor(s): Material type: TextPublication details: Chichester ; [Hoboken] : John Wiley & Sons, 2010.Description: xxxvii, 285 p. : illSubject(s): Genre/Form: DDC classification:
  • 658.15/5 22
LOC classification:
  • HD61 .O66 2010eb
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2010. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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