01459nam a22003611i 4500 ebr10762543 CaPaEBR m o d cr cn||||||||| 131006s2013 enka ob 001 0 eng d 9783527655090 (e-book) 9783527410774 CaPaEBR eng rda pn CaPaEBR (OCoLC)858655510 QC482.S3 S82 2014eb 539.7222 23 Stangl, Julian. Nanobeam x-ray scattering : probing matter at the nanoscale / Julian Stangl [and three others]. Hoboken, New Jersey : John Wiley & sons, 2013. 1 online resource (392 pages) : illustrations text rdacontent computer rdamedia online resource rdacarrier Includes bibliographical references and index. Description based on online resource; title from PDF title page (ebrary, viewed October 6, 2013). Electronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Electron probe microanalysis. Nanotechnology. X-rays Scattering. Electronic books. ebrary. http://site.ebrary.com/lib/rucke/Doc?id=10762543 An electronic book accessible through the World Wide Web; click to view 121971 121971