TY  - BOOK
AU  - Stangl,Julian
TI  - Nanobeam x-ray scattering: probing matter at the nanoscale 
SN  - 9783527655090 (e-book)
AV  - QC482.S3 S82 2014eb
U1  - 539.7222 23
PY  - 2013///
CY  - Hoboken, New Jersey
PB  - John Wiley & sons
KW  - Electron probe microanalysis
KW  - Nanotechnology
KW  - X-rays
KW  - Scattering
KW  - Electronic books
N1  - Includes bibliographical references and index
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10762543
ER  -