TY  - BOOK
AU  - Bauwens,Christopher M.
ED  - ebrary, Inc.
TI  - X-ray scattering
T2  - Materials science and technologies
AV  - TA417.25 .X74 2012eb
U1  - 621.36/73 22
PY  - 2012///
CY  - New York
PB  - Nova Science Publishers, Inc.
KW  - Radiography, Industrial
KW  - X-rays
KW  - Scattering
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2013; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10683480
ER  -