01347nam a2200349 a 4500001001200000003000800012006001900020007001500039008004100054010001700095020003000112020002700142020002700169040002100196035002100217050002600238082001800264245007900282260005500361300002200416490003900438504005100477533015200528650002900680650002400709655002900733700002800762710001700790830004700807856012600854999001700980ebr10683480CaPaEBRm        u        cr cn|||||||||110426s2012    nyua    sb    001 0 eng d  z  2011012584  z9781613243268 (hardcover)  z161324326X (hardcover)  z9781624175060 (e-book)  aCaPaEBRcCaPaEBR  a(OCoLC)83686427514aTA417.25b.X74 2012eb04a621.36/7322200aX-ray scatteringh[electronic resource] /cChristopher M. Bauwens, editor.  aNew York :bNova Science Publishers, Inc.,cc2012.  ax, 247 p. :bill.1 aMaterials science and technologies  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2013.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aRadiography, Industrial. 0aX-raysxScattering. 7aElectronic books.2local1 aBauwens, Christopher M.2 aebrary, Inc. 0aMaterials science and technologies series.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10683480zAn electronic book accessible through the World Wide Web; click to view  c13612d13612