TY  - BOOK
AU  - Kapur,Rohit
ED  - ebrary, Inc.
TI  - CTL for test information of digital ICs
AV  - TK7874.65 .K35 2003eb
U1  - 621.3815/48 21
PY  - 2003///
CY  - Boston
PB  - Kluwer Academic Publishers
KW  - Digital integrated circuits
KW  - Testing
KW  - Standards
KW  - Computer hardware description languages
KW  - Electronic books
KW  - local
N1  - Electronic reproduction; Palo Alto, Calif.; ebrary; 2013; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10067206
ER  -