01387nam a2200361Ia 4500 ebr10317806 CaPaEBR m u cr cn||||||||| 090423s2009 enk sb 001 0 eng d 2009015206 9780470511374 (cloth) CaPaEBR CaPaEBR (OCoLC)441888589 TK7871.852 .V65 2009eb 621.381 22 Voldman, Steven H. ESD [electronic resource] : failure mechanisms and models / Steven H. Voldman. Electrostatic discharge Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009. xxiv, 384 p. Includes bibliographical references and index. Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Semiconductors Failures. Integrated circuits Protection. Integrated circuits Testing. Integrated circuits Reliability. Electric discharges. Electrostatics. Electronic books. local ebrary, Inc. http://site.ebrary.com/lib/rucke/Doc?id=10317806 An electronic book accessible through the World Wide Web; click to view 166745 166745