01223nam a2200277Ia 4500001001200000003000800012006001900020007001500039008004100054020001800095040002100113035002100134050002700155100002400182245011100206260007600317300001900393504005100412533015200463650005600615650006500671650003700736655002900773710001700802856012600819ebr10570978CaPaEBRm        u        cr cn|||||||||120813s2012    ts a    sb    001 0 eng d  z9781608053599  aCaPaEBRcCaPaEBR  a(OCoLC)81137162814aTK7871.85b.W65 2012eb1 aWong, Terence K. S.10aSemiconductor strain metrologyh[electronic resource] :bprinciples and applications /cTerence K.S. Wong.  a[Saif Zone, Sharjah, U.A.E] ;aOak Park, IL :bBentham Science,c[2012]  a136 p. :bill.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2011.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aSemiconductorsxDesign and constructionxMaterials. 0aCompound semiconductorsxDesign and constructionxMaterials. 0aSilicon-on-insulator technology. 7aElectronic books.2local2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10570978zAn electronic book accessible through the World Wide Web; click to view