01244nam a22003134a 4500001001200000003000800012006001900020007001500039008004100054010001700095020002300112040002100135035002000156050002500176082001900201100002200220245012400242260003800366300002600404504006400430533015200494650003500646650003400681655002900715700002400744710001700768856012600785999001900911ebr10114034CaPaEBRm        u        cr cn|||||||||031015s2004    njua    sb    001 0 eng    z  2003063488  z047143308X (cloth)  aCaPaEBRcCaPaEBR  a(OCoLC)5635450814aTK7867.2bM66 2004eb04a621.382/242221 aMontrose, Mark I.10aTesting for EMC complianceh[electronic resource] :bapproaches and techniques /cMark I. Montrose, Edward M. Nakauchi.  aHoboken, NJ :bJohn Wiley,c2004.  axviii, 460 p. :bill.  aIncludes bibliographical references (p. 447-451) and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2013.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aElectromagnetic compatibility. 0aElectromagnetic interference. 7aElectronic books.2local1 aNakauchi, Edward M.2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10114034zAn electronic book accessible through the World Wide Web; click to view  c209743d209743