@book{246113,
	author = {Ross, Richard J. and ebrary, Inc.},
	title = {Microelectronics failure analysis},
	publisher = {ASM International,},
	year = {c2011.},
	address = {Materials Park, Ohio :},
	edition = {6th ed.},
	url = {http://site.ebrary.com/lib/rucke/Doc?id=10540838}
}