01991nam a2200385 a 4500 ebr10540838 CaPaEBR m u cr cn||||||||| 120128s2011 ohua sbf 001 0 eng d 2012359075 161503725X 9781615037254 9781615037261 (e-book) CaPaEBR CaPaEBR (OCoLC)771901447 TK7871 .M52 2011eb 621.381 23 Microelectronics failure analysis [electronic resource] : desk reference / edited by Richard J. Ross. 6th ed. Materials Park, Ohio : ASM International, c2011. xi, 660 p. : ill. Includes bibliographical references and indexes. section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information. Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Electronics Materials Testing Handbooks, manuals, etc. Microelectronics Materials Testing Handbooks, manuals, etc. Microelectronics Materials Defects Handbooks, manuals, etc. Electronic apparatus and appliances Testing Handbooks, manuals, etc. Semiconductors Defects Handbooks, manuals, etc. Electronic books. local Ross, Richard J. ebrary, Inc. http://site.ebrary.com/lib/rucke/Doc?id=10540838 An electronic book accessible through the World Wide Web; click to view 246113 246113