01231nam a2200313Ia 4500001001200000003000800012006001900020007001500039008004100054010001700095020002900112020001800141040002100159035002100180050002500201082001600226245013300242260005300375300001100428504005100439533015200490650003700642650002300679655002900702700002600731710001700757856012600774999001700900ebr10687758CaPaEBRm        u        cr cn|||||||||130215s2013    nju     sb    001 0 eng d  z  2012045181  z9780470886052 (hardback)  z9781118589250  aCaPaEBRcCaPaEBR  a(OCoLC)84191444514aQD96.S43bM34 2013eb04a543/.6522300aCluster secondary ion mass spectrometryh[electronic resource] :bprinciples and applications /cedited by Christine M. Mahoney.  aHoboken, N.J. :bJohn Wiley & Sons, Inc.,c2013.  a348 p.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2013.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aSecondary ion mass spectrometry. 0aMass spectrometry. 7aElectronic books.2local1 aMahoney, Christine M.2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10687758zAn electronic book accessible through the World Wide Web; click to view  c28513d28513