@book{39948,
	author = {International Symposium for Testing and Failure Analysis and Electronic Device Failure Analysis Society,},
	title = {ISTFA 2014 :},
	publisher = {ASM International,},
	year = {2014.},
	address = {Materials Park, Ohio :},
	note = {Includes index.},
	url = {http://site.ebrary.com/lib/rucke/Doc?id=10998999}
}