02237nam a2200397 i 4500 ebr10998999 CaPaEBR m o d cr cn||||||||| 150109t20142014ohuao o 001 0 eng d 9781627080743 9781627080750 (e-book) CaPaEBR eng rda pn CaPaEBR (OCoLC)900889018 TK7871 .I884 2014eb 621.381 23 International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.) ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / organized by Electronic Device Failure Analysis Society, ASM International. Materials Park, Ohio : ASM International, 2014. �2014 1 online resource (560 pages) : color illustrations, photographs text rdacontent computer rdamedia online resource rdacarrier Includes index. Description based on online resource; title from PDF title page (ebrary, viewed January 9, 2014). Electronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Electronics Materials Testing Congresses. Electronic apparatus and appliances Testing Congresses. Electronic books. Electronic Device Failure Analysis Society, organizer. ASM International, organizer. Print version: International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.) ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA. Materials Park, Ohio : ASM International, c2014 xx, 540 pages 9781627080743 ebrary. http://site.ebrary.com/lib/rucke/Doc?id=10998999 An electronic book accessible through the World Wide Web; click to view 39948 39948