01455nam a22003614a 4500001001200000003000800012006001900020007001500039008004100054010001700095020004000112040002100152035002100173050002700194082001600221100002600237245010700263260005000370300002400420490004200444504006400486533015200550650002700702650005000729650002600779650003200805655002900837700002400866710001700890830004300907856012600950999001701076ebr10067374CaPaEBRm        u        cr cn|||||||||010202s2001    maua    sb    001 0 eng    z  2001023211  z0792373146 (hardcover : alk. paper)  aCaPaEBRcCaPaEBR  a(OCoLC)61472368414aTK7870.23b.S64 2001eb04a621.3812211 aSousa, Jos�e T. de.10aBoundary-scan interconnect diagnosish[electronic resource] /cJos�e T. de Sousa, Peter Y.K. Cheung.  aBoston :bKluwer Academic Publishers,cc2001.  axxi, 168 p. :bill.1 aFrontiers in electronic testing ;v18  aIncludes bibliographical references (p. 145-150) and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2013.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aBoundary scan testing. 0aElectronic apparatus and appliancesxTesting. 0aElectronic packaging. 0aElectric contactsxTesting. 7aElectronic books.2local1 aCheung, Peter Y. K.2 aebrary, Inc. 0aFrontiers in electronic testing ;v18.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10067374zAn electronic book accessible through the World Wide Web; click to view  c49118d49118