01431nam a2200301 a 4500001001200000003000800012006001900020007001500039008004100054020001500095020001800110020002700128040002100155035002100176050002400197111010600221245020900327260005400536300003600590504005100626533015200677650004900829650006200878655002900940710001700969856012600986999001701112ebr10627944CaPaEBRm        u        cr cn|||||||||121211s2012    ohuad   sb    101 0 eng d  z1615039791  z9781615039791  z9781615039951 (e-book)  aCaPaEBRcCaPaEBR  a(OCoLC)82372913114aTK7801b.I58 2012eb2 aInternational Symposium for Testing and Failure Analysisn(38th :d2012 :cPhoenix Convention Center)10aISTFA 2012h[electronic resource] :bconference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.  aMaterials Park, Ohio :bASM International,c2012.  axxi, 620 p. :bill. (some col.)  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2011.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aElectronicsxMaterialsxTestingvCongresses. 0aElectronic apparatus and appliancesxTestingvCongresses. 7aElectronic books.2local2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10627944zAn electronic book accessible through the World Wide Web; click to view  c50849d50849