01495nam a2200337Ia 4500001001200000003000800012006001900020007001500039008004100054020001800095040002100113035002100134050002600155111010400181245013800285260002900423300002600452490007500478504005100553533015200604650004600756650004000802655002900842700002100871700002100892700002000913710001700933830006400950856012601014999001701140ebr10331638CaPaEBRm        u        cr cn|||||||||090924s2009    ne a    sb    101 0 eng d  z9781607500230  aCaPaEBRcCaPaEBR  a(OCoLC)49126500514aTA417.3b.E484 2009eb2 aInternational Workshop on Electromagnetic Nondestructive Evaluationn(13th :d2008 :cSeoul, Korea)10aElectromagnetic nondestructive evaluation (XII)h[electronic resource] /cedited by Young-Kil Shin, Hyang-Beom Lee and Sung-Jin Song.  aAmsterdam :bIOS,c2009.  axxvii, 416 p. :bill.1 aStudies in applied electromagnetics and mechanics,x1383-7281 ;vv. 32  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2011.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aElectromagnetic measurementsvCongresses. 0aNondestructive testingvCongresses. 7aElectronic books.2local1 aShin, Young-Kil.1 aLee, Hyang-Beom.1 aSong, Sung-Jin.2 aebrary, Inc. 0aStudies in applied electromagnetics and mechanics ;vv. 32.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10331638zAn electronic book accessible through the World Wide Web; click to view  c51402d51402