01245nam a2200301Ia 4500 ebr10325826 CaPaEBR m u cr cn||||||||| 081027s2009 si a sb 001 0 eng d 2008045600 9780470824078 (cloth) CaPaEBR CaPaEBR (OCoLC)669008259 TK7871.99.M44 K47 2009eb Ker, Ming-Dou. Transient-induced latchup in CMOS integrated circuits [electronic resource] / Ming-Dou Ker and Sheng-Fu Hsu. Singapore ; Hoboken, NJ : Wiley, c2009. xiii, 249 p. : ill. Includes bibliographical references and index. Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Metal oxide semiconductors, Complementary Defects. Metal oxide semiconductors, Complementary Reliability. Electronic books. local Hsu, Sheng-Fu. ebrary, Inc. http://site.ebrary.com/lib/rucke/Doc?id=10325826 An electronic book accessible through the World Wide Web; click to view 54156 54156