TY  - BOOK
AU  - Ker,Ming-Dou
AU  - Hsu,Sheng-Fu
ED  - ebrary, Inc.
TI  - Transient-induced latchup in CMOS integrated circuits
AV  - TK7871.99.M44 K47 2009eb
PY  - 2009///
CY  - Singapore, Hoboken, NJ
PB  - Wiley
KW  - Metal oxide semiconductors, Complementary
KW  - Defects
KW  - Reliability
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10325826
ER  -