TY  - BOOK
AU  - Benso,Alfredo
AU  - Prinetto,Paolo
ED  - ebrary, Inc.
TI  - Fault injection techniques and tools for embedded systems reliability evaluation
T2  - Frontiers in electronic testing
AV  - TK7895.E42 F38 2003eb
U1  - 004.2/56 22
PY  - 2003///
CY  - Boston
PB  - Kluwer Academic Publishers
KW  - Embedded computer systems
KW  - Testing
KW  - Reliability
KW  - Fault location (Engineering)
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references (p. [231]-241); Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10078628
ER  -