TY  - BOOK
AU  - Davidson,Grace M.
ED  - International Symposium for Testing and Failure Analysis
ED  - ASM International.
ED  - ebrary, Inc.
TI  - ISTFA '97: proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California 
AV  - TK7871.85 .I57775 1997eb
PY  - 1997///
CY  - Materials Park, OH
PB  - ASM International
KW  - Electronics
KW  - Materials
KW  - Testing
KW  - Congresses
KW  - Electronic apparatus and appliances
KW  - Electronic books
KW  - local
N1  - "Manager of Book Production Grace M. Davidson."; Includes bibliographic references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10323496
ER  -