01650nam a2200337Ia 4500 ebr10323502 CaPaEBR m u cr cn||||||||| 990316s1998 ohua sb 101 0 eng d 98073971 9780871706690 0871706695 CaPaEBR CaPaEBR (OCoLC)646817834 TK7871.85 .I48 1998eb International Symposium for Testing and Failure Analysis (24th : 1998 : Dallas, Tex.) ISTFA '98 [electronic resource] : proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas / sponsored by ISFTA, ASM International. Proceedings of the 24th International Symposium for Testing and Failure Analysis Conference proceedings from the 24th International Symposium for Testing and Failure Analysis Materials Park, OH : ASM International, c1998. xix, 490 p. : ill. Includes bibliographical references and index. Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Electronics Materials Testing Congresses. Electronic apparatus and appliances Testing Congresses. Electronic books. local ASM International. ebrary, Inc. http://site.ebrary.com/lib/rucke/Doc?id=10323502 An electronic book accessible through the World Wide Web; click to view 54750 54750