01354nam a2200289 a 4500001001200000003000800012006001900020007001500039008004100054020001800095020001500113040002100128035002100149050002400170111010000194245016900294260005500463300002400518533015200542650004900694650006200743655002900805710007000834710001700904856012600921999001701047ebr10323517CaPaEBRm        u        cr cn|||||||||091007s1996    ohua    s     100 0 eng d  z9780871705826  z0871705826  aCaPaEBRcCaPaEBR  a(OCoLC)64681790514aTK7871b.I58 1996eb2 aInternational Symposium for Testing and Failure Analysisn(22nd :d1996 :cLos Angeles, Calif.)10aISTFA '96h[electronic resource] :bproceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.  aMaterials Park, Ohio :bASM International,cc1996.  axiv, 417 p. :bill.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2013.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aElectronicsxMaterialsxTestingvCongresses. 0aElectronic apparatus and appliancesxTestingvCongresses. 7aElectronic books.2local2 aASM International.bElectronic Materials and Processing Division.2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10323517zAn electronic book accessible through the World Wide Web; click to view  c54755d54755