01556nam a2200313Ia 4500 ebr10328960 CaPaEBR m u cr cn||||||||| 041208s2004 ohua sb 101 0 eng d 9780871708078 0871708078 CaPaEBR CaPaEBR (OCoLC)646827305 TK7871 .I68 2004eb International Symposium for Testing and Failure Analysis (30th : 2004 : Boston, Mass.) ISTFA 2004 [electronic resource] : proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASTM International. Materials Park, OH : ASM International, c2004. [717] p. : ill. Includes bibliographical references and index. Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Electronics Materials Testing Congresses. Electronic apparatus and appliances Testing Congresses. Electronic books. local ASM International. Electronic Device Failure Analysis Society. ebrary, Inc. http://site.ebrary.com/lib/rucke/Doc?id=10328960 An electronic book accessible through the World Wide Web; click to view 54774 54774