01627nam a2200325Ia 4500001001200000003000800012006001900020007001500039008004100054020002800095020002500123040002100148035002100169050002400190111009300214245019100307246008500498246009800583260005200681300002300733504005100756533015200807650004900959650006201008650003601070655002901106710002301135710001701158856012601175ebr10328965CaPaEBRm        u        cr cn|||||||||061210s2006    ohua    sb    001 0 eng d  z9780871708441 ($165.00)  z0871708442 ($165.00)  aCaPaEBRcCaPaEBR  a(OCoLC)64682731214aTK7871b.I68 2006eb2 aInternational Symposium for Testing and Failure Analysisn(23rd :d2006 :cAustin, Tex.)10aISTFA 2006h[electronic resource] :bproceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.30aProceedings of the 32nd International Symposium for Testing and Failure Analysis3 aConference proceedings from the 32nd International Symposium for Testing and Failure Analysis  aMaterials Park, OH :bASM International,c2006.  axx, 524 p. :bill.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2009.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aElectronicsxMaterialsxTestingvCongresses. 0aElectronic apparatus and appliancesxTestingvCongresses. 0aMaterialsxTestingvCongresses. 7aElectronic books.2local2 aASM International.2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10328965zAn electronic book accessible through the World Wide Web; click to view