TY  - BOOK
ED  - International Symposium for Testing and Failure Analysis
ED  - ASM International.
ED  - Electronic Device Failure Analysis Society.
ED  - ebrary, Inc.
TI  - ISTFA 2003: proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California 
AV  - TK7871 .I68 2003eb
PY  - 2003///
CY  - Materials Park, Ohio
PB  - ASM International
KW  - Electronics
KW  - Materials
KW  - Testing
KW  - Congresses
KW  - Electronic apparatus and appliances
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10328966
ER  -