01563nam a2200325Ia 4500 ebr10330016 CaPaEBR m u cr cn||||||||| 021220s2002 ohua sbf 001 0 eng d 0871707691 9780871707697 CaPaEBR CaPaEBR (OCoLC)609419839 TK7871 .M52 2002eb Microelectronic failure analysis [electronic resource] : desk reference. 2002 supplement / prepared under the direction of the Electronic Device Failure Analysis Society publications committee. Materials Park, OH : ASM International, c2002. vi, 210 p. : ill. Includes bibliographical references and index. Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Electronic apparatus and appliances Testing Handbooks, manuals, etc. Electronics Materials Testing Handbooks, manuals, etc. Microelectronics Materials Defects Handbooks, manuals, etc. Microelectronics Materials Testing Handbooks, manuals, etc. Semiconductors Defects Handbooks, manuals, etc. Electronic books. local Electronic Device Failure Analysis Society. ebrary, Inc. http://site.ebrary.com/lib/rucke/Doc?id=10330016 An electronic book accessible through the World Wide Web; click to view 55422 55422