TY  - BOOK
ED  - Electronic Device Failure Analysis Society.
ED  - ebrary, Inc.
TI  - Microelectronic failure analysis: desk reference
AV  - TK7871 .M52 2002eb
PY  - 2002///
CY  - Materials Park, OH
PB  - ASM International
KW  - Electronic apparatus and appliances
KW  - Testing
KW  - Handbooks, manuals, etc
KW  - Electronics
KW  - Materials
KW  - Microelectronics
KW  - Defects
KW  - Semiconductors
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10330016
ER  -