01613nam a2200313Ia 4500001001200000003000800012006001900020007001500039008004100054020001500095040002100110035002100131050002500152111009500177245021000272246008500482246009800567260005200665300002500717504005100742533015200793650004900945650006200994655002901056710002301085710004801108710001701156856012601173ebr10320302CaPaEBRm        u        cr cn|||||||||030325s2002    ohua    sb    101 0 eng d  z0871707713  aCaPaEBRcCaPaEBR  a(OCoLC)64782814214aTK7871b.I684 2002eb2 aInternational Symposium for Testing and Failure Analysisn(28th :d2002 :cPhoenix, Ariz.)10aISTFA 2002h[electronic resource] :bproceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /csponsored by EDFAS, ISTFA.30aProceedings of the 28th International Symposium for Testing and Failure Analysis3 aConference proceedings from the 28th International Symposium for Testing and Failure Analysis  aMaterials Park, OH :bASM International,c2002.  axxiv, 789 p. :bill.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2009.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aElectronicsxMaterialsxTestingvCongresses. 0aElectronic apparatus and appliancesxTestingvCongresses. 7aElectronic books.2local2 aASM International.2 aElectronic Device Failure Analysis Society.2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10320302zAn electronic book accessible through the World Wide Web; click to view