01642nam a2200325Ia 4500 ebr10320302 CaPaEBR m u cr cn||||||||| 030325s2002 ohua sb 101 0 eng d 0871707713 CaPaEBR CaPaEBR (OCoLC)647828142 TK7871 .I684 2002eb International Symposium for Testing and Failure Analysis (28th : 2002 : Phoenix, Ariz.) ISTFA 2002 [electronic resource] : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / sponsored by EDFAS, ISTFA. Proceedings of the 28th International Symposium for Testing and Failure Analysis Conference proceedings from the 28th International Symposium for Testing and Failure Analysis Materials Park, OH : ASM International, 2002. xxiv, 789 p. : ill. Includes bibliographical references and index. Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Electronics Materials Testing Congresses. Electronic apparatus and appliances Testing Congresses. Electronic books. local ASM International. Electronic Device Failure Analysis Society. ebrary, Inc. http://site.ebrary.com/lib/rucke/Doc?id=10320302 An electronic book accessible through the World Wide Web; click to view 60834 60834