01673nam a2200337Ia 4500 ebr10320364 CaPaEBR m u cr cn||||||||| 010517s2000 ohua sb 101 0 eng d 0871707012 CaPaEBR CaPaEBR (OCoLC)647829189 TA409 .I577 2000eb International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.) ISTFA 2000 [electronic resource] : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. Proceedings of the 26th International Symposium or Testing and Failure Analysis Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis Materials Park, OH : ASM International, c2000. xvi, 577 p. : ill. "Sponsored by EDFAS, ISTFA". Includes bibliographical references and index. Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Electronics Materials Testing Congresses. Electronic apparatus and appliances Testing Congresses. Electronic books. local ASM International. Electronic Device Failure Analysis Society. ebrary, Inc. http://site.ebrary.com/lib/rucke/Doc?id=10320364 An electronic book accessible through the World Wide Web; click to view 60864 60864