01569nam a2200325Ia 4500001001200000003000800012006001900020007001500039008004100054020001800095020002200113040002100135035002100156050002400177245020200201260005300403300002200456504005100478533015200529650006200681650006700743650006700810650007500877650005400952655002901006710004801035710001701083856012601100999001701226ebr10320372CaPaEBRm        u        cr cn|||||||||020606s2001    ohua    sb f  001 0 eng d  z9780871707451  z0871707454 (pbk.)  aCaPaEBRcCaPaEBR  a(OCoLC)64782919714aTK7871b.M53 2001eb00aMicroelectronic failure analysish[electronic resource] :bdesk reference : 2001 supplement /cprepared under the direction of the Electronic Device Failure Analysis Society Publications Committee.  aMaterials Park, OH :bASM International,cc2001.  av, 171 p. :bill.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2009.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aElectronicsxMaterialsxTestingvHandbooks, manuals, etc. 0aMicroelectronicsxMaterialsxTestingvHandbooks, manuals, etc. 0aMicroelectronicsxMaterialsxDefectsvHandbooks, manuals, etc. 0aElectronic apparatus and appliancesxTestingvHandbooks, manuals, etc. 0aSemiconductorsxDefectsvHandbooks, manuals, etc. 7aElectronic books.2local2 aElectronic Device Failure Analysis Society.2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10320372zAn electronic book accessible through the World Wide Web; click to view  c60871d60871