TY  - BOOK
ED  - International Symposium for Testing and Failure Analysis
ED  - ASM International.
ED  - Electronic Device Failure Analysis Society.
ED  - ebrary, Inc.
TI  - ISTFA 2001: proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California 
AV  - TK7871 .I69 2001eb
PY  - 2001///
CY  - Materials Park, OH
PB  - ASM International
KW  - Electronics
KW  - Materials
KW  - Testing
KW  - Congresses
KW  - Electronic apparatus and appliances
KW  - Electronic books
KW  - local
N1  - Sponsored by EDFAS, ISTFA; Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10320377
ER  -