01731nam a2200349Ia 4500001001200000003000800012006001900020007001500039008004100054020001800095020001500113040002100128035002100149050002400170111010000194245022300294246008400517246009800601260005300699300002400752500003100776504005100807533015200858650004901010650006201059655002901121710002301150710004801173710001701221856012601238999001701364ebr10320377CaPaEBRm        u        cr cn|||||||||020214s2001    ohua    sb    101 0 eng d  z9780871707468  z0871707462  aCaPaEBRcCaPaEBR  a(OCoLC)64782920914aTK7871b.I69 2001eb2 aInternational Symposium for Testing and Failure Analysisn(27th :d2001 :cSanta Clara, Calif.)10aISTFA 2001h[electronic resource] :bproceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /csponsored by EDFAS.30aProceedings of the 27th International Symposium or Testing and Failure Analysis30aConference Proceedings from the 27th International Symposium for Testing and Failure Analysis  aMaterials Park, OH :bASM International,cc2001.  axix, 485 p. :bill.  aSponsored by EDFAS, ISTFA.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2009.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aElectronicsxMaterialsxTestingvCongresses. 0aElectronic apparatus and appliancesxTestingvCongresses. 7aElectronic books.2local2 aASM International.2 aElectronic Device Failure Analysis Society.2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10320377zAn electronic book accessible through the World Wide Web; click to view  c60875d60875