01310nam a2200337 a 4500001001100000003000800011006001900019007001500038008004100053010001700094020002800111040002100139035002100160050002300181082002600204100002200230245008700252260003400339300001600373490003800389504006600427533015200493650005200645650002600697655002900723700002400752710001700776830003900793856012500832999001500957ebr5006014CaPaEBRm        u        cr cn|||||||||980818s1999    nyu     sb    001 0 eng    z   98031039   z0387986332 (alk. paper)  aCaPaEBRcCaPaEBR  a(OCoLC)55906986214aTA169b.A95 1999eb04a620/.00452/0151182211 aAven, T.q(Terje)10aStochastic models in reliabilityh[electronic resource] /cTerje Aven, Uwe Jensen.  aNew York :bSpringer,cc1999.  axii, 270 p.1 aApplications of mathematics ;v41  aIncludes bibliographical references (p. [253]-265) and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2013.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aReliability (Engineering)xMathematical models. 0aStochastic processes. 7aElectronic books.2local1 aJensen, Uwe,d1931-2 aebrary, Inc. 0aApplications of mathematics ;v41.40uhttp://site.ebrary.com/lib/rucke/Doc?id=5006014zAn electronic book accessible through the World Wide Web; click to view  c6187d6187