01653nam a2200385 a 4500 ebr10670956 CaPaEBR m u cr cn||||||||| 080909s2009 nyua sb 001 0 eng d 2008039627 9781606922637 (softcover) 9781614701118 (e-book) CaPaEBR CaPaEBR (OCoLC)759866034 TA169.6 .Y36 2009eb 620/.0044 22 Yang, O-Suk. Introduction of intelligent machine fault diagnosis and prognosis [electronic resource] / Bo-Suk Yang and Achmad Widodo. New York : Nova Science Publishers, c2009. ix, 351 p. : ill. Includes bibliographical references and index. Data acquisition, processing, and analysis -- Feature extraction and clustering -- Feature selection -- Fault classification algorithms -- Decision fusion algorithms -- Fault prognosis algorithms. Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Fault location (Engineering) Automation. Automatic test equipment. Expert systems (Computer science) Conscious automata. Machine learning. Machinery Testing. Electronic books. local Widodo, Achmad. ebrary, Inc. http://site.ebrary.com/lib/rucke/Doc?id=10670956 An electronic book accessible through the World Wide Web; click to view 61922 61922