01653nam a2200385 a 4500001001200000003000800012006001900020007001500039008004100054010001700095020003000112020002700142040002100169035002100190050002500211082001800236100001700254245012700271260004900398300002300447504005100470505020100521533015200722650004600874650003000920650003800950650002400988650002201012650002401034655002901058700002001087710001701107856012601124999001701250ebr10670956CaPaEBRm        u        cr cn|||||||||080909s2009    nyua    sb    001 0 eng d  z  2008039627  z9781606922637 (softcover)  z9781614701118 (e-book)  aCaPaEBRcCaPaEBR  a(OCoLC)75986603414aTA169.6b.Y36 2009eb04a620/.00442221 aYang, O-Suk.10aIntroduction of intelligent machine fault diagnosis and prognosish[electronic resource] /cBo-Suk Yang and Achmad Widodo.  aNew York :bNova Science Publishers,cc2009.  aix, 351 p. :bill.  aIncludes bibliographical references and index.0 aData acquisition, processing, and analysis -- Feature extraction and clustering -- Feature selection -- Fault classification algorithms -- Decision fusion algorithms -- Fault prognosis algorithms.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2013.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aFault location (Engineering)xAutomation. 0aAutomatic test equipment. 0aExpert systems (Computer science) 0aConscious automata. 0aMachine learning. 0aMachineryxTesting. 7aElectronic books.2local1 aWidodo, Achmad.2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10670956zAn electronic book accessible through the World Wide Web; click to view  c61922d61922